Publication List
2003
Authors: H. Klauk, M. Halik, U. Zschieschang, R. Brederlow, S. Briole, M. Schütz, S. Maisch, F. Effenberger, G. Schmid, and C. Dehm
Journal: International Electron Devices Meeting Technical Digest, 2003, 195‑198
DOI: 10.1109/IEDM.2003.1269240
Authors: W. Weber, R. Brederlow, S. Briole, R. Glaser, Y. Gsottberger, M. Halik, S. Jung, H. Klauk, C. Lauterbach, G. Schmid, T. Sturm, G. Stromberg, R. Thewes, and U. Zschieschang
Journal: 2003 International Electron Devices Meeting Technical Digest, 2003, 3‑10 (invited paper)
DOI: 10.1109/IEDM.2003.1269154
Authors: G. Schmid, H. Klauk, M. Halik, U.Zschieschang, F. Eder and C. Dehm
Journal: mstnews (VDI/VDE-IT), 2003, S03, 19 – 21
Authors: U. Zschieschang, H. Klauk, M. Halik, G. Schmid, C. Dehm
Journal: Advanced Materials, 2003, 15 (14), 1147 – 1151
DOI: 10.1002/adma.200305012
Authors: M. Halik, H. Klauk, U. Zschieschang, G.Schmid, S. Ponomarenko, S. Kirchmeyer
Journal: Mat. Res. Soc. Symp. Proc, 2003, 771, 11 - 16
DOI: 10.1557/PROC-771-L3.2
Authors: M. Halik, H. Klauk, U. Zschieschang, G.Schmid, S. Ponomarenko, S. Kirchmeyer, W. Weber
Journal: Advanced Materials, 2003, 15 (11), 917 – 922
DOI: 10.1002/adma.200304654
Authors: H. Klauk, M. Halik, U. Zschieschang, F. Eder, G. Schmid, C. Dehm
Journal: Appl. Phys. Lett. , 2003, 82, 4175 - 4177
DOI: 10.1063/1.1579870
Authors: M. Halik, W. Wenseleers, C. Grasso, F. Stellacci, E. Zojer, S. Barlow, J.-L. Bredas, J.W. Perry, S.R. Marder
Journal: Chem. Comm. , 2003, 13, 1490 – 1491 (hot paper)
DOI: 10.1039/B303135G
Authors: M. Halik, H. Klauk, U. Zschieschang, G. Schmid, W. Radlik, S. Ponomarenko, S. Kirchmeyer, W. Weber
Journal: J. Appl. Phys., 2003, 93 (5), 2977 – 2981
DOI: 10.1063/1.1543246
Authors: H. Klauk, F. Eder, M. Halik, U. Zschieschang, G. Schmid, C. Dehm, and R. Treutlein
Journal: 61st Device Research Conference Digest, 2003, 183‑184
DOI: 10.1109/DRC.2003.1226924
Authors: R. Brederlow, S. Briole, H. Klauk, M. Halik, U. Zschieschang, G. Schmid, J.-M. Gorriz-Saez, C. Pacha, R. Thewes, W. Weber
Journal: – 2003 IEEE Internat. Solid State Circuit Conference – Tech. Dig., 2003, 1, 378 - 500
DOI: 10.1109/ISSCC.2003.1234344
Authors: C. Risko, S. Barlow, V. Coropceanu, M. Halik, J.L. Bredas, S.R. Marder
Journal: Chem. Comm., 2003, 194 – 195
DOI: 10.1039/B210429F