Authors: H. Klauk, M. Halik, F. Eder, G. Schmid, C. Dehm, U. Zschieschang, D. Rohde, R. Brederlow, S. Briole, S. Maisch, and F. Effenberger
Journal: International Electron Devices Meeting Technical Digest, 2004, 369 – 372
DOI: 10.1109/IEDM.2004.1419160
Authors: M. Halik, H. Klauk, U. Zschieschang, G. Schmid, C. Dehm, M. Schütz, S. Maisch, F. Effenberger, M. Brunnbauer and F. Stellacci
Journal: Nature, 2004, 431, 963 - 966
DOI: 10.1038/nature02987
Authors: E. Zojer, W. Wenseleers, M. Halik, C. Grasso, S. Barlow, J. W. Perry, S. R. Marder, J. L. Bredas
Journal: ChemPhysChem, 2004, 5 (7), 982 - 988
DOI: 10.1002/cphc.200301023
Authors: E. Zojer, W. Wenseleers, P. Pacher, S. Barlow, M. Halik, C. Grasso, J. W. Perry, S. R. Marder and J.-L. Brédas
Journal: J. Phys. Chem. B., 2004, 8641–8646
DOI: 10.1021/jp036754s
Authors: Domercq, B.; Grasso, C.; Maldonado, J.-L.; Halik, M.; Barlow, S.; Marder, S. R.; Kippelen, B.
Journal: J. Phys. Chem. B. , 2004, 108 (25), 8647-8651
DOI: 10.1021/jp036779r
Authors: H. Klauk, M. Halik, U. Zschieschang, F. Eder, G. Schmid, C. Dehm
Journal: 62nd Device Research Conference Digest, 2004, 1, 230 – 231
DOI: 10.1109/DRC.2004.1367880
Authors: F. Eder, H. Klauk, M. Halik, U. Zschieschang, G. Schmid, C. Dehm
Journal: Appl. Phys. Lett., 2004, 84, 2673 – 2675
DOI: 10.1063/1.1690870
Authors: S.M. Kuebler, K.L. Braun, F. Stellacci, C.A. Bauer, M. Halik, W. Zhou, T. Yu, C.K. Ober, S.R. Marder and J.W. Perry
Journal: Polymeric Materials: Science and Engineering, 2004, 91, 342 - 343
DOI: 10.1109/LEOS.2004.1363362
